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Study of d-doped GaAs layers by micro-Raman spectroscopy on bevelled samples

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Author:R. Srnanek, J. Geurts, M. Lentze, G. Irmer, D. Donoval, P. Brdecka, P. Kordos, Arnold Förster, B. Sciana, D. Radziewicz, M. Tlaczala
ISBN:0169-4332
Parent Title (English):Applied surface science . 230 (2004), H. 1 -4
Document Type:Article
Language:English
Year of Completion:2004
Date of the Publication (Server):2012/12/18
First Page:379
Last Page:385
Note:
ISSN der E-Ausg.: 0169-4332
Link:http://dx.doi.org/10.1016/j.apsusc.2004.02.056
Zugriffsart:campus
Institutes:FH Aachen / Fachbereich Energietechnik
FH Aachen / INB - Institut für Nano- und Biotechnologien