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The double-LNN Calibration technique for scattering parameter measurements of microstrip devices

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Metadaten
Author:Holger Heuermann, Burkhard Schiek
Parent Title (English):Conference proceedings
Publisher:NEXUS House
Place of publication:Kent
Document Type:Article
Language:English
Year of Completion:1995
Date of the Publication (Server):2012/12/18
First Page:343
Last Page:347
Note:
European Microwave Conference <25, 1995, Bologna>
Link:http://dx.doi.org/10.1109/EUMA.1995.336976
Zugriffsart:campus
Institutes:FH Aachen / Fachbereich Elektrotechnik und Informationstechnik