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LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements

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Metadaten
Author:Holger Heuermann
Document Type:Article
Language:English
Year of Completion:1995
Date of the Publication (Server):2012/12/18
First Page:129
Last Page:136
Note:
45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk;  ARFTG Conference digest ; 4
Link:http://dx.doi.org/10.1109/ARFTG.1995.327116
Zugriffsart:campus
Institutes:FH Aachen / Fachbereich Elektrotechnik und Informationstechnik