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Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures

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Metadaten
Author:Holger HeuermannORCiD
Document Type:Article
Language:English
Year of Completion:1996
Date of the Publication (Server):2012/12/18
First Page:136
Last Page:145
Note:
46th ARFTG conference digest : November 30 - December 1. 1995, Safari Resort, Scottsdale, Arizona / Automatic RF Techniques Group. [Publ. chairman: Ed. Godshalk]
Link:http://dx.doi.org/10.1109/ARFTG.1996.327174
Zugriffsart:campus
Institutes:FH Aachen / Fachbereich Elektrotechnik und Informationstechnik

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