DX Centers in Al0.3Ga0.7As/GaAs Analyzed by Point Contact Measurements. Hauke, M.; Jakumeit, J.; Krafft, B.; Nimtz, G.; Förster, A.; Lüth, H.
| Author: | Arnold Förster, M. Hauke, J. Jakumeit, B. Krafft |
|---|---|
| ISBN: | 1089-7550 |
| Parent Title (English): | Journal of Applied Physics. 84 (1998), H. 4 |
| Document Type: | Article |
| Language: | English |
| Year of Completion: | 1998 |
| Date of the Publication (Server): | 2012/12/18 |
| First Page: | 2034 |
| Last Page: | 2039 |
| Link: | http://dx.doi.org/10.1063/1.368261 |
| Zugriffsart: | campus |
| Institutes: | FH Aachen / Fachbereich Energietechnik |
