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Determining the optimized layer-by-layer film architecture with dendrimer/carbon nanotubes for field-effect sensors

  • The capacitive electrolyte–insulator–semiconductor (EIS) structure is a typical device based on a field-effect sensor platform. With a simple silicon-based structure, EIS have been useful for several sensing applications, especially with incorporation of nanostructured films to modulate the ionic transport and the flat-band potential. In this paper, we report on ion transport and changes in flat-band potential in EIS sensors made with layer-by-layer films containing poly(amidoamine) (PAMAM) dendrimer and single-walled carbon nanotubes (SWNTs) adsorbed on p-Si/SiO 2 /Ta 2 O 5 chips with an Al ohmic contact. The impedance spectra were fitted using an equivalent circuit model, from which we could determine parameters such as the double-layer capacitance. This capacitance decreased with the number of bilayers owing to space charge accumulated at the electrolyte–insulator interface, up to three PAMAM/SWNTs bilayers, after which it stabilized. The charge-transfer resistance was also minimum for three bilayers, thus indicating that this is the ideal architecture for an optimized EIS performance. The understanding of the influence of nanostructures and the fine control of operation parameters pave the way for optimizing the design and performance of new EIS sensors.

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Metadaten
Author:Marcos A. M. Sousa, Jose R. Jr. Siqueira, Andres Vercik, Michael Josef SchöningORCiD, Osvaldo N. Jr. Oliveira
DOI:https://doi.org/10.1109/JSEN.2017.2653238
ISSN:1558-1748
Parent Title (English):IEEE Sensors Journal
Publisher:IEEE
Place of publication:New York
Document Type:Article
Language:English
Year of Completion:2017
Date of the Publication (Server):2017/05/19
Volume:17
Issue:6
First Page:1735
Last Page:1740
Link:https://doi.org/10.1109/JSEN.2017.2653238
Zugriffsart:campus
Institutes:FH Aachen / Fachbereich Medizintechnik und Technomathematik
FH Aachen / INB - Institut für Nano- und Biotechnologien
collections:Verlag / IEEE