Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
| Author: | Klaus Prume, S. Tiedke, T. Schmitz, A. Roelofs |
|---|---|
| ISBN: | 0003-6951 |
| Parent Title (English): | Applied Physics Letters. 79 (2001), H. 22 |
| Document Type: | Article |
| Language: | English |
| Year of Completion: | 2001 |
| Date of the Publication (Server): | 2012/12/18 |
| First Page: | 3678 |
| Last Page: | 3680 |
| Link: | http://dx.doi.org/10.1063/1.1421638 |
| Zugriffsart: | campus |
| Institutes: | FH Aachen / Fachbereich Elektrotechnik und Informationstechnik |
