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Functional testing and characterisation of ISFETs on wafer level by means of a micro-droplet cell

  • A wafer-level functionality testing and characterisation system for ISFETs (ionsensitive field-effect transistor) is realised by means of integration of a specifically designed capillary electrochemical micro-droplet cell into a commercial wafer prober-station. The developed system allows the identification and selection of “good” ISFETs at the earliest stage and to avoid expensive bonding, encapsulation and packaging processes for nonfunctioning ISFETs and thus, to decrease costs, which are wasted for bad dies. The developed system is also feasible for wafer-level characterisation of ISFETs in terms of sensitivity, hysteresis and response time. Additionally, the system might be also utilised for wafer-level testing of further electrochemical sensors.

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Metadaten
Author:Arshak PoghossianORCiD, Kerstin Schumacher, Joachim P. Kloock, Christian Rosenkranz, Joachim W. Schultze, Mattea Müller-Veggian, Michael Josef SchöningORCiD
URN:urn:nbn:de:hbz:a96-opus-1259
DOI:https://doi.org/10.21269/104
Document Type:Conference Proceeding
Language:English
Year of Completion:2006
Publishing Institution:Fachhochschule Aachen
Contributing Corporation:International Symposium on Sensor Science, I3S 2005 <3; 2005; Juelich, Germany>
Date of the Publication (Server):2006/04/05
Tag:Biosensorik; ISFET; Wafer
ISFET; capillary micro-droplet cell; wafer-level testing
GND Keyword:Biosensor
Source:http://www.mdpi.org/sensors/papers/s6040397.pdf
Institutes:FH Aachen / Fachbereich Medizintechnik und Technomathematik
FH Aachen / INB - Institut für Nano- und Biotechnologien
Dewey Decimal Classification:5 Naturwissenschaften und Mathematik / 57 Biowissenschaften; Biologie / 570 Biowissenschaften; Biologie
collections:FH Aachen / International Symposium on Sensor Science, I3S 2005 <3; 2005; Ju