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Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique

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Metadaten
Author:Holger Heuermann, Burkhard Schiek
ISBN:0-9518032-5-5
Parent Title (English):Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994]
Publisher:Nexus Business Communications
Place of publication:Swanley
Document Type:Article
Language:English
Year of Completion:1994
Date of the Publication (Server):2012/12/18
Note:
European Microwave Conference <24, 1994, Cannes>
Institutes:FH Aachen / Fachbereich Elektrotechnik und Informationstechnik