In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
| Author: | Klaus Prume, B. Reichenberg, A. Roelofs, R. Waser |
|---|---|
| ISBN: | 0955-2219 |
| Parent Title (English): | Journal of the European Ceramic Society. 24 (2004), H. 6 |
| Document Type: | Article |
| Language: | English |
| Year of Completion: | 2004 |
| Date of the Publication (Server): | 2012/12/18 |
| First Page: | 1145 |
| Last Page: | 1147 |
| Note: | Electroceramics VIII |
| Link: | http://dx.doi.org/10.1016/S0955-2219(03)00583-1 |
| Zugriffsart: | bezahl |
| Institutes: | FH Aachen / Fachbereich Elektrotechnik und Informationstechnik |
