Visualization of the recovery process of defects in a cultured cell layer by chemical imaging sensor
- The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) in the sample. In this study, a novel cell assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the recovery of defects in a cell layer brought into proximity of the sensing surface. A reduced impedance at a defect formed artificially in a cell layer was successfully visualized in a photocurrent image. The cell layer was cultured over two weeks, during which the temporal change of the photocurrent distribution corresponding to the recovery of the defect was observed.
Author: | Ko-ichiro Miyamoto, Bing Yu, Hiroko Isoda, Torsten WagnerORCiD, Michael Josef SchöningORCiD, Tatsuo Yoshinobu |
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DOI: | https://doi.org/10.1016/j.snb.2016.04.018 |
ISSN: | 0925-4005 |
Parent Title (German): | Sensors and Actuators B: Chemical |
Publisher: | Elsevier |
Place of publication: | Amsterdam |
Document Type: | Article |
Language: | German |
Year of Completion: | 2016 |
Volume: | 236 |
First Page: | 965 |
Last Page: | 969 |
Link: | https://doi.org/10.1016/j.snb.2016.04.018 |
Zugriffsart: | campus |
Institutes: | FH Aachen / Fachbereich Medizintechnik und Technomathematik |
FH Aachen / INB - Institut für Nano- und Biotechnologien | |
collections: | Verlag / Elsevier |