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Author
Burkhard Schiek
(17)
Holger Heuermann
(17)
Reinhard Stolle
(3)
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1997
(1)
1995
(4)
1994
(5)
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(2)
1992
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1991
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English
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A Fast and Robust Procedure for the Determination of the Scattering Parameters for Network Analyzer Calibration
(1992)
Holger Heuermann
;
Burkhard Schiek
Error Corrected Impedance Measurements with a Network Analyzer
(1994)
Holger Heuermann
;
Burkhard Schiek
A Generalization of the Txx Network Analyzer Self-Calibration Procedure
(1992)
Holger Heuermann
;
Burkhard Schiek
The In-Fixture Calibration Procedure Line-Network-Network-LNN
(1992)
Holger Heuermann
;
Burkhard Schiek
Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
(1994)
Holger Heuermann
;
Burkhard Schiek
The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
(1995)
Holger Heuermann
;
Burkhard Schiek
Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
(1994)
Holger Heuermann
;
Burkhard Schiek
11
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17