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S. Menzel (1)
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Degradation of thin poly(lactic acid) films: characterization by capacitance-voltage, atomic force microscopy, scanning electron microscopy and contact-angle measurements
(2013)
Sebastian Schusser
;
S. Menzel
;
Matthias Bäcker
;
Marcel Leinhos
;
Arshak Poghossian
;
P. Wagner
;
Michael J. Schöning
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