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Degradation of thin poly(lactic acid) films: characterization by capacitance-voltage, atomic force microscopy, scanning electron microscopy and contact-angle measurements
(2013)
Schusser, Sebastian
;
Menzel, S.
;
Bäcker, Matthias
;
Leinhos, Marcel
;
Poghossian, Arshak
;
Wagner, P.
;
Schöning, Michael Josef
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