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Förster, Arnold
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Darmo, J.
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Dubecký, F.
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Kordos, P.
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Annealing effect on concentration of EL6-like deep-level state in low-temperature-grown molecular beam epitaxial GaAs. Darmo, J.; Dubecky, F.; Kordos, P.; Förster, A.
(1998)
Förster, Arnold
;
Darmo, J.
;
Dubecky, F.
;
Kordos, P.
Annealing characteristics of native defects in low-temperature-grown MBE GaAs / J. Darmo ; F. Dubecky ; P. Kordos ; A. Förster
(1996)
Förster, Arnold
;
Darmo, J.
;
Dubecký, F.
;
Kordos, P.
Investigation of deep-level states in bulk and low temperature MBE semiinsulating GaAs by admittance transient spectroscopy / F. Dubecky ; J. Darmo ; M. Darviras ; A. Förster ...
(1994)
Förster, Arnold
;
Dubecký, F.
;
Darmo, J.
Deep-level states and electrical properties of GaAs grown at 250 °C / J. Darmo ; F. Dubecký ; P. Kordos ; A. Förster ...
(1994)
Förster, Arnold
;
Darmo, J.
;
Dubecký, F.
;
Kordos, P.
On the spectrometric performance limit of radiation detectors based on semi-insulating GaAs
(2004)
Zatko, B.
;
Dubecký, F.
;
Bohacek, P.
;
Gombia, E.
;
Frigeri, P.
;
Mosca, R.
;
Franchi, S.
;
Huarn, J.
;
Nescas, V.
;
Sekacova, M.
;
Förster, Arnold
;
Kordos, P.
1
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5