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Prume, Klaus
(19)
Waser, Rainer
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Roelofs, A.
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Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
(2000)
Prume, Klaus
;
Franken, Klaus
;
Maier, Horst R.
;
Waser, Rainer
Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
(2000)
Prume, Klaus
;
Waser, Rainer
;
Franken, Klaus
;
Maier, Horst R.
Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
(2002)
Prume, Klaus
;
Franken, Klaus
;
Böttger, Ulrich
;
Waser, Rainer
Modellierung und Simulation der elektrisch-thermisch-mechanisch gekoppelten Eigenschaften keramischer Vielschichtstrukturen
(2001)
Prume, Klaus
Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; Rüdiger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;
(2005)
Prume, Klaus
;
Peter, F.
;
Rüdiger, A.
;
Dittmann, R.
Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; Kügeler, C. ; Roelofs, A. ; Böttger, U. ; Waser, R. ; Schmitz-Kempen,
(2004)
Prume, Klaus
;
Gerber, Peter
;
Kügeler, Carsten
;
Roelofs, Andreas
Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
(2001)
Prume, Klaus
;
Tiedke, S.
;
Schmitz, T.
;
Roelofs, A.
Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; Kügeler, C.; Böttger, U. ; Waser, R. ; Prume, K. ;
(2004)
Prume, Klaus
;
Gerber, P.
;
Roelofs, A.
;
Kügeler, C.
Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer
(2000)
Prume, Klaus
;
Waser, Rainer
Electrical and electromechanical characterization of piezoelectric thin films in view of MEMS application / Tiedke, S. ; Prume, K. ; Schmitz-Kempen, T.;
(2007)
Prume, Klaus
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