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The influence of contact effects on the dielectric behavior of diffuse phase transitions. Stumpe, R.; Wagner, D.; Bäuerle, D.; Hagemann, H. J. (1985)

Hans-Jürgen Hagemann ; R. Stumpe ; D. Wagner ; D. Bäuerle

Reduction of geometric taper losses in the PCVD process. Geittner, P.; Hagemann, H. J.; Warnier, J.; Weling, F.; Wilson, H. (1985)

Hans-Jürgen Hagemann ; P. Geittner ; J. Warnier ; F. Weling

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