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Functional testing and characterisation of ISFETs on wafer level by means of a micro-droplet cell
(2006)
A wafer-level functionality testing and characterisation system for ISFETs (ionsensitive field-effect transistor) is realised by means of integration of a specifically designed capillary electrochemical micro-droplet cell into a commercial wafer prober-station. The developed system allows the identification and selection of “good” ISFETs at the earliest stage and to avoid expensive bonding, encapsulation and packaging processes for nonfunctioning ISFETs and thus, to decrease costs, which are wasted for bad dies. The developed system is also feasible for wafer-level characterisation of ISFETs in terms of sensitivity, hysteresis and response time. Additionally, the system might be also utilised for wafer-level testing of further electrochemical sensors.
In this paper the way to a 5-day-car with respect to a modular valve train systems for spark ignited combustion engines is shown. The necessary product diversity is shift from mechanical or physical components to software components. Therefore, significant improvements of logistic indicators are expected and shown. The working principle of a camless cylinder head with respect to an electromagnetical valve train (EMVT) is explained and it is demonstrated that shifting physical diversity to software is feasible. The future design of combustion engine systems including customisation can be supported by a set of assistance tools which is shown exemplary.