LZY: A Self-Calibration Approach in Competition to the LRM Method for On-Wafer Measurements
Author: | Holger HeuermannORCiD |
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Document Type: | Article |
Language: | English |
Year of Completion: | 1995 |
First Page: | 129 |
Last Page: | 136 |
Note: | 45th ARFTG Conference digest, Spring 1995 : [conference topic: Testing and design of RFIC'S], May 19, 1995, Orange County Convention Center, Orlando, Florida / Automatic RF Techniques Group. Publications chairman: Ed Godshalk; ARFTG Conference digest ; 4 |
Link: | http://dx.doi.org/10.1109/ARFTG.1995.327116 |
Zugriffsart: | campus |
Institutes: | FH Aachen / Fachbereich Elektrotechnik und Informationstechnik |