Sure Methods of On-Wafer Scattering Parameter Measurements with Self-Calibration Procedures
Author: | Holger HeuermannORCiD |
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Document Type: | Article |
Language: | English |
Year of Completion: | 1996 |
First Page: | 136 |
Last Page: | 145 |
Note: | 46th ARFTG conference digest : November 30 - December 1. 1995, Safari Resort, Scottsdale, Arizona / Automatic RF Techniques Group. [Publ. chairman: Ed. Godshalk] |
Link: | http://dx.doi.org/10.1109/ARFTG.1996.327174 |
Zugriffsart: | campus |
Institutes: | FH Aachen / Fachbereich Elektrotechnik und Informationstechnik |