Atomic scale strain measurements by the digital analysis of transmission electron microscopic lattice images / A. Rosenauer ; T. Remmele ; D. Gerthsen ... A. Förster
Author: | Arnold Förster, A. Rosenauer, T. Remmele |
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ISBN: | 0030-4026 |
Parent Title (English): | Optik : international journal for light and electron optics. 105 (1997), H. 3 |
Document Type: | Article |
Language: | English |
Year of Completion: | 1997 |
First Page: | 99 |
Last Page: | 107 |
Institutes: | FH Aachen / Fachbereich Energietechnik |