Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
Author: | Holger HeuermannORCiD, Burkhard Schiek |
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ISBN: | 0-9518032-5-5 |
Parent Title (English): | Conference proceedings : [Palais des Festivals et des Congrès Cannes, France, 5 - 8 September 1994] |
Publisher: | Nexus Business Communications |
Place of publication: | Swanley |
Document Type: | Article |
Language: | English |
Year of Completion: | 1994 |
Note: | European Microwave Conference <24, 1994, Cannes> |
Institutes: | FH Aachen / Fachbereich Elektrotechnik und Informationstechnik |