The Levenberg–Marquardt method applied to a parameter estimation problem arising from electrical resistivity tomography
Author: | Andreas KleefeldORCiD, Martin Reißel |
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ISBN: | 0096-3003 |
Parent Title (English): | Applied Mathematics and Computation |
Publisher: | Elsevier |
Place of publication: | Amsterdam |
Document Type: | Article |
Language: | English |
Year of Completion: | 2011 |
Volume: | 217 |
Issue: | 9 |
First Page: | 4490 |
Last Page: | 4501 |
Link: | http://dx.doi.org/10.1016/j.amc.2010.10.052 |
Zugriffsart: | campus |
Institutes: | FH Aachen / Fachbereich Medizintechnik und Technomathematik |
collections: | Verlag / Elsevier |