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Thin film electrodes for trace metal analysis by dc resistance changes

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Metadaten
Author:Michael Josef SchöningORCiD, O. Glück, P. Kordos, H. Lüth, H. Emons
Parent Title (English):Proceedings of SPIE. 3857 (1999)
Document Type:Article
Language:English
Year of Completion:1999
Date of the Publication (Server):2012/12/18
First Page:135
Last Page:143
Link:http://dx.doi.org/10.1117/12.370279
Zugriffsart:bezahl
Institutes:FH Aachen / Fachbereich Medizintechnik und Technomathematik

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