Study of d-doped GaAs layers by micro-Raman spectroscopy on bevelled samples
Author: | R. Srnanek, J. Geurts, M. Lentze, G. Irmer, D. Donoval, P. Brdecka, P. Kordos, Arnold Förster, B. Sciana, D. Radziewicz, M. Tlaczala |
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ISBN: | 0169-4332 |
Parent Title (English): | Applied surface science . 230 (2004), H. 1 -4 |
Document Type: | Article |
Language: | English |
Year of Completion: | 2004 |
Date of the Publication (Server): | 2012/12/18 |
First Page: | 379 |
Last Page: | 385 |
Note: | ISSN der E-Ausg.: 0169-4332 |
Link: | http://dx.doi.org/10.1016/j.apsusc.2004.02.056 |
Zugriffsart: | campus |
Institutes: | FH Aachen / Fachbereich Energietechnik |
FH Aachen / INB - Institut für Nano- und Biotechnologien |