DX Centers in Al0.3Ga0.7As/GaAs Analyzed by Point Contact Measurements. Hauke, M.; Jakumeit, J.; Krafft, B.; Nimtz, G.; Förster, A.; Lüth, H.
Author: | Arnold Förster, M. Hauke, J. Jakumeit, B. Krafft |
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ISBN: | 1089-7550 |
Parent Title (English): | Journal of Applied Physics. 84 (1998), H. 4 |
Document Type: | Article |
Language: | English |
Year of Completion: | 1998 |
First Page: | 2034 |
Last Page: | 2039 |
Link: | http://dx.doi.org/10.1063/1.368261 |
Zugriffsart: | campus |
Institutes: | FH Aachen / Fachbereich Energietechnik |