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Klaus Prume (18)
(entfernen)
Erscheinungsjahr
2008
(1)
2007
(6)
2005
(2)
2004
(3)
2002
(2)
2001
(1)
2000
(3)
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Englisch (18)
(entfernen)
18
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Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.
(2007)
Klaus Prume
;
H. Raeder
;
F. Tyholdt
;
W. E. Booij
Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates / Zalachas, Nicolas ; Laskewitz, Bernd ; Kamlah, Marc ; Prume, Klaus ; Lapusta, Yuri ; Tiedke, Stephan
(2008)
Klaus Prume
;
Nicolas Zalachas
;
Bernd Laskewitz
;
Marc Kamlah
Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan
(2007)
Klaus Prume
;
Paul Muralt
;
Florian Calame
;
Thorsten Schmitz-Kempen
A simple and powerful analytical model for MEMS piezoelectric multimorphs / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.
(2007)
Klaus Prume
;
W. E. Booij
;
A. H. Vogl
;
D. T. Wang
Chemically derived seeding layer for {100}-textured PZT thin films / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P.
(2007)
Klaus Prume
;
F. Tyholdt
;
F. Calame
;
H. Raeder
Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
(2002)
Klaus Prume
;
Klaus Franken
;
Ulrich Böttger
;
Rainer Waser
Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb
(2002)
Klaus Prume
;
Andreas Roelofs
;
Thorsten Schmitz
;
Bernd Reichenberg
Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, René ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan
(2005)
Klaus Prume
;
René Meyer
;
Rainer Waser
;
Torsten Schmitz
Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
(2000)
Klaus Prume
;
Klaus Franken
;
Horst R. Maier
;
Rainer Waser
Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
(2000)
Klaus Prume
;
Rainer Waser
;
Klaus Franken
;
Horst R. Maier
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