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Control of Aharonov-Bohm oscillations in a AlGaAs/GaAs ring by asymmetric and symmetric gate biasing
(2001)
Weak Representation of the Cumulative Hazard Function under Semiparametric Random Censorship Models
(2001)
Fatigue analyses are conducted with the aim of verifying that thermal ratcheting is limited. To this end it is important to make a clear distintion between the shakedown range and the ratcheting range (continuing deformation). As part of an EU-supported research project, experiments were carried out using a 4-bar model. The experiment comprised a water-cooled internal tube, and three insulated heatable outer test bars. The system was subjected to alternating axial forces, superimposed with alternating temperatures at the outer bars. The test parameters were partly selected on the basis of previous shakedown analyses. During the test, temperatures and strains were measured as a function of time. The loads and the resulting stresses were confirmed on an ongoing basis during performance of the test, and after it. Different material models were applied for this incremental elasto-plastic analysis using the ANSYS program. The results of the simulation are used to verify the FEM-based shakedown analysis.
The load-carrying capacity or the safety against plastic limit states are the central questions in the design of structures and passive components in the apparatus engineering. A precise answer is most simply given by limit and shakedown analysis. These methods can be based on static and kinematic theorems for lower and upper bound analysis. Both may be formulated as optimization problems for finite element discretizations of structures. The problems of large-scale analysis and the extension towards realistic material modelling will be solved in a European research project. Limit and shakedown analyses are briefly demonstrated with illustrative examples.
An ISFET-based penicillin sensor with high sensitivity, low detection limit and long lifetime
(2001)
Penicillin detection by means of field-effect based sensors: EnFET, capacitive EIS sensor or LAPS?
(2001)
Analyse der Studentenwohnungen des Solar-Campus Jülich / Göttsche, Joachim ; Gabrysch, Karten
(2001)