Refine
Year of publication
- 2000 (108) (remove)
Institute
- Fachbereich Medizintechnik und Technomathematik (51)
- INB - Institut für Nano- und Biotechnologien (32)
- Fachbereich Elektrotechnik und Informationstechnik (19)
- Fachbereich Energietechnik (14)
- Fachbereich Chemie und Biotechnologie (8)
- Fachbereich Luft- und Raumfahrttechnik (5)
- Fachbereich Wirtschaftswissenschaften (4)
- Solar-Institut Jülich (3)
- Fachbereich Gestaltung (1)
- Fachbereich Maschinenbau und Mechatronik (1)
Language
- English (108) (remove)
Document Type
- Article (84)
- Book (12)
- Conference Proceeding (12)
Keywords
- Einspielen <Werkstoff> (3)
- Finite-Elemente-Methode (3)
- FEM (2)
- limit load (2)
- Ansaugsystem (1)
- Basis Reduktion (1)
- Basis reduction (1)
- Blitzschutz (1)
- Convex optimization (1)
- Druckgeräte (1)
Limit and shakedown analysis are effective methods for assessing the load carrying capacity of a given structure. The elasto–plastic behavior of the structure subjected to loads varying in a given load domain is characterized by the shakedown load factor, defined as the maximum factor which satisfies the sufficient conditions stated in the corresponding static shakedown theorem. The finite element dicretization of the problem may lead to very large convex optimization. For the effective solution a basis reduction method has been developed that makes use of the special problem structure for perfectly plastic material. The paper proposes a modified basis reduction method for direct application to the two-surface plasticity model of bounded kinematic hardening material. The considered numerical examples show an enlargement of the load carrying capacity due to bounded hardening.
Nobody ever dies! / 1. ed.
(2000)
Penicillin detection by means of field-effect based sensors: EnFET, capacitive EIS sensor or LAPS?
(2000)
Abstracts of the ACHEMA 2000 - International Meeting on Chemical Engineering, Environmental Protection and Biotechnology, May 22 - 27, 2000. Frankfurt am Main. Achema 2000 : special edition / Linde. [Ed.: Linde AG. Red.: Volker R. Leski]. - Wiesbaden : Linde AG, 2000. - 56 p. : Ill., . - pp: 79 - 81
Limit Analysis of Defects
(2000)