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Andreas Roelofs (2)
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2004
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Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb
(2002)
Klaus Prume
;
Andreas Roelofs
;
Thorsten Schmitz
;
Bernd Reichenberg
Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; Kügeler, C. ; Roelofs, A. ; Böttger, U. ; Waser, R. ; Schmitz-Kempen,
(2004)
Klaus Prume
;
Peter Gerber
;
Carsten Kügeler
;
Andreas Roelofs
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