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Klaus Prume (1)
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2001 (1)
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Fachbereich Elektrotechnik und Informationstechnik (1)
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Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
(2001)
Klaus Prume
;
S. Tiedke
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T. Schmitz
;
A. Roelofs
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