Deutsch
Login
Open Access
Home
Search
Browse
Administration
FAQ
Refine
Author
Klaus Prume (19)
(remove)
Year of publication
2008
(1)
2007
(6)
2005
(2)
2004
(3)
2002
(2)
2001
(2)
2000
(3)
Document Type
Article
(18)
Book
(1)
Language
English
(18)
German
(1)
19
search hits
11
to
19
Export
BibTeX
CSV
RIS
10
10
20
50
100
Sort by
Year
Year
Title
Title
Author
Author
Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
(2000)
Klaus Prume
;
Klaus Franken
;
Horst R. Maier
;
Rainer Waser
Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
(2000)
Klaus Prume
;
Rainer Waser
;
Klaus Franken
;
Horst R. Maier
Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer
(2000)
Klaus Prume
;
Rainer Waser
In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
(2004)
Klaus Prume
;
B. Reichenberg
;
A. Roelofs
;
R. Waser
Modellierung und Simulation der elektrisch-thermisch-mechanisch gekoppelten Eigenschaften keramischer Vielschichtstrukturen
(2001)
Klaus Prume
Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
(2002)
Klaus Prume
;
Klaus Franken
;
Ulrich Böttger
;
Rainer Waser
Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices / Prume, K. ; Muralt, P. ; Calame, F. ; Schmitz-Kempen, T. ; Tiedke, S. ;
(2007)
Klaus Prume
;
P. Muralt
;
F. Calame
;
T. Schmitz-Kempen
Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; Kügeler, C. ; Roelofs, A. ; Böttger, U. ; Waser, R. ; Schmitz-Kempen,
(2004)
Klaus Prume
;
Peter Gerber
;
Carsten Kügeler
;
Andreas Roelofs
Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.
(2007)
Klaus Prume
;
H. Raeder
;
F. Tyholdt
;
W. E. Booij
11
to
19