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Institute
- Fachbereich Elektrotechnik und Informationstechnik (98) (remove)
Calibration procedures with series impedances and unknown lines simplify on-wafer measurements
(1999)
Robuster Algorithmus zur Streuparameterbestimmung für systemfehlerkorrigierte Netzwerkanalysatoren
(1991)
Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
(1994)
The double-LNN Calibration technique for scattering parameter measurements of microstrip devices
(1995)
Advanced on-wafer multiport calibration methods for mono- and mixed-mode device characterization
(2004)
Novel balanced inductor for compact differential systems / Sadeghfam, Arash; Heuermann, Holger
(2004)
Chain scattering parameters or T-parameters are a useful tool for calculating cascaded two-ports. With the increasing importance of mixed-mode S-parameters, a need for converting the T-parameters from their unbalanced form into a balanced form emerges for suiting both common and differential mode waves, as well as the mode conversion. This paper presents the derivation of the equations for transformations between mixed-mode S- and T-parameters for a mixed-mode two-port. Although derived in a way very similar to monomode T-parameters, no simplifications were necessary. Measurement results exemplify the quality of the T-parameter transformation under real-life conditions.