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Klaus Prume (2)
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2007
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2001
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Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
(2001)
Klaus Prume
;
S. Tiedke
;
T. Schmitz
;
A. Roelofs
Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices / Prume, K. ; Muralt, P. ; Calame, F. ; Schmitz-Kempen, T. ; Tiedke, S. ;
(2007)
Klaus Prume
;
P. Muralt
;
F. Calame
;
T. Schmitz-Kempen
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