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Author
Arnold Förster (26)
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2005
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Fachbereich Energietechnik
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INB - Institut für Nano- und Biotechnologien
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Evaluation of dopant profiles and diffusion constants by means of electron energy loss spectroscopy
(1989)
Arnold Förster
;
J. M. Layet
;
H. Lüth
Surface reactions of trimethylgallium and trimethylarsenic on silicon surfaces
(1989)
Arnold Förster
;
H. Lüth
The effect of inhomogeneous dopant profiles on the electron energy loss spectra of Si(100) /
(1988)
Arnold Förster
;
J. M. Layet
;
H. Lüth
The Schottky barrier at the InSb(110)–Sn interface
(1987)
Arnold Förster
;
A. Tulke
;
H. Lüth
Investigation of the InSb(110)-Sn schottky barrier by means of electron energy loss spectroscopy
(1987)
Arnold Förster
;
H. Lüth
The adsorption of fluor-carbon complexes on GaAs(110) studied by electron energy loss spectroscopy
(1986)
Arnold Förster
;
A. Spitzer
;
H. Lüth
21
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