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Förster, Arnold
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Lüth, H.
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Epitaxial growth and characterization of Si/NiSi2/Si(111) heterostructures / Angela Rizzi ; A. Förster ; H. Lüth
(1989)
Förster, Arnold
;
Rizzi, Angela
;
Lüth, H.
Evaluation of dopant profiles and diffusion constants by means of electron energy loss spectroscopy
(1989)
Förster, Arnold
;
Layet, J. M.
;
Lüth, H.
The Schottky barrier at the InSb(110)–Sn interface
(1987)
Förster, Arnold
;
Tulke, A.
;
Lüth, H.
Surface reactions of trimethylgallium and trimethylarsenic on silicon surfaces
(1989)
Förster, Arnold
;
Lüth, H.
The adsorption of fluor-carbon complexes on GaAs(110) studied by electron energy loss spectroscopy
(1986)
Förster, Arnold
;
Spitzer, A.
;
Lüth, H.
Investigation of the InSb(110)-Sn schottky barrier by means of electron energy loss spectroscopy
(1987)
Förster, Arnold
;
Lüth, H.
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