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Author
Klaus Prume
(19)
Rainer Waser
(5)
A. Roelofs
(3)
Klaus Franken
(3)
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(2)
F. Tyholdt
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(2)
Horst R. Maier
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Bernd Laskewitz
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Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
(2000)
Klaus Prume
;
Klaus Franken
;
Horst R. Maier
;
Rainer Waser
Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
(2000)
Klaus Prume
;
Rainer Waser
;
Klaus Franken
;
Horst R. Maier
Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
(2002)
Klaus Prume
;
Klaus Franken
;
Ulrich Böttger
;
Rainer Waser
Modellierung und Simulation der elektrisch-thermisch-mechanisch gekoppelten Eigenschaften keramischer Vielschichtstrukturen
(2001)
Klaus Prume
Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; Rüdiger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;
(2005)
Klaus Prume
;
F. Peter
;
A. Rüdiger
;
R. Dittmann
Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; Kügeler, C. ; Roelofs, A. ; Böttger, U. ; Waser, R. ; Schmitz-Kempen,
(2004)
Klaus Prume
;
Peter Gerber
;
Carsten Kügeler
;
Andreas Roelofs
Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
(2001)
Klaus Prume
;
S. Tiedke
;
T. Schmitz
;
A. Roelofs
Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; Kügeler, C.; Böttger, U. ; Waser, R. ; Prume, K. ;
(2004)
Klaus Prume
;
P. Gerber
;
A. Roelofs
;
C. Kügeler
Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer
(2000)
Klaus Prume
;
Rainer Waser
In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
(2004)
Klaus Prume
;
B. Reichenberg
;
A. Roelofs
;
R. Waser
1
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