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Prume, Klaus
(19)
Waser, Rainer
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Roelofs, A.
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Calame, F.
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Author
Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan
(2007)
Prume, Klaus
;
Muralt, Paul
;
Calame, Florian
;
Schmitz-Kempen, Thorsten
Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
(2000)
Prume, Klaus
;
Franken, Klaus
;
Maier, Horst R.
;
Waser, Rainer
Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
(2000)
Prume, Klaus
;
Waser, Rainer
;
Franken, Klaus
;
Maier, Horst R.
Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer
(2000)
Prume, Klaus
;
Waser, Rainer
In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
(2004)
Prume, Klaus
;
Reichenberg, B.
;
Roelofs, A.
;
Waser, R.
Modellierung und Simulation der elektrisch-thermisch-mechanisch gekoppelten Eigenschaften keramischer Vielschichtstrukturen
(2001)
Prume, Klaus
Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
(2002)
Prume, Klaus
;
Franken, Klaus
;
Böttger, Ulrich
;
Waser, Rainer
Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices / Prume, K. ; Muralt, P. ; Calame, F. ; Schmitz-Kempen, T. ; Tiedke, S. ;
(2007)
Prume, Klaus
;
Muralt, P.
;
Calame, F.
;
Schmitz-Kempen, T.
Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; Kügeler, C. ; Roelofs, A. ; Böttger, U. ; Waser, R. ; Schmitz-Kempen,
(2004)
Prume, Klaus
;
Gerber, Peter
;
Kügeler, Carsten
;
Roelofs, Andreas
Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.
(2007)
Prume, Klaus
;
Raeder, H.
;
Tyholdt, F.
;
Booij, W. E.
10
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