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Förster, Arnold
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Schmidt, T.
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Metamorphic InAlAs/InGaAs HEMT's on GaAs substrates using an InP buffer layer
(2000)
Schmidt, R.
;
Tonnesmann, A.
;
Förster, Arnold
;
Grimm, M.
;
Kordos, P.
;
Lüth, H.
Imaging the local density of states in a disordered semiconductor / T. Schmidt ; R. J. Haug ; V. I. Fal'ko ... A. Förster ...
(1996)
Förster, Arnold
;
Schmidt, T.
;
Haug, R. J.
Spectroscopy of local density of states fluctuations in a disordered conductor / T. Schmidt ; R. J. Haug ; V. I. Fal'ko ... A. Förster ...
(1996)
Förster, Arnold
;
Schmidt, T.
;
Haug, R. J.
Spectroscopy of the single-particle states of a quantum-dot molecule / T. Schmidt ; R. J. Haug ; K. v. Klitzing ; A. Förster ...
(1997)
Förster, Arnold
;
Schmidt, T.
;
Haug, R. J.
Observation of the local structure of landau bands in a disordered conductor / T. Schmidt ; R. J. Haug ; Vladimir I. Fal'ko ... A. Förster ...
(1997)
Förster, Arnold
;
Schmidt, T.
;
Haug, R. J.
Single-electron transport in small resonant-tunneling diodes with various barrier-thickness asymmetries / T. Schmidt ; R. J. Haug ; K. v. Klitzing ; A. Förster ...
(1997)
Förster, Arnold
;
Schmidt, T.
;
Haug, R. J.
Peak-to-valley ratio of small resonant-tunneling diodes with various barrier-thickness asymmetries / T. Schmidt ; M. Tewordt ; R. J. Haug ... A. Förster ...
(1996)
Förster, Arnold
;
Schmidt, T.
;
Tewordt, M.
;
Haug, R. J.
Quantum-dot ground states in a magnetic field studied by single-electron tunneling spectroscopy on double-barrier heterostructures / T. Schmidt ; M. Tewordt ; R. H. Blick ... A. Förster ...
(1995)
Förster, Arnold
;
Schmidt, T.
;
Tewordt, M.
;
Blick, R. H.
Structural and Chemical Investigation of In-0.6Ga0.4As Stranski-Krastanow Layers Burried in GaAs by Transmission Electron Microscopy
(2000)
Rosenauer, A.
;
Oberst, W.
;
Litvinov, D.
;
Gerthsen, D.
;
Förster, Arnold
;
Schmidt, R.
1
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