IEEE
Refine
Year of publication
Institute
- Fachbereich Elektrotechnik und Informationstechnik (44)
- Fachbereich Medizintechnik und Technomathematik (19)
- MASKOR Institut für Mobile Autonome Systeme und Kognitive Robotik (11)
- ECSM European Center for Sustainable Mobility (8)
- Fachbereich Maschinenbau und Mechatronik (7)
- INB - Institut für Nano- und Biotechnologien (7)
- Fachbereich Energietechnik (5)
- Fachbereich Chemie und Biotechnologie (2)
- Fachbereich Luft- und Raumfahrttechnik (2)
- Freshman Institute (1)
Has Fulltext
- no (78)
Document Type
- Article (45)
- Conference Proceeding (32)
- Contribution to a Periodical (1)
Keywords
- Engineering education (2)
- Hot S-parameter (2)
- Training (2)
- 10BASE-T1L (1)
- 3-D printing (1)
- Accuracy (1)
- Agent-based modeling (1)
- Analytical models (1)
- Asset Administration Shell (1)
- Automated driving (1)
The Volatility Framework is a collection of tools for the analysis of computer RAM. The framework offers a multitude of analysis options and is used by many investigators worldwide. Volatility currently comes with a command line interface only, which might be a hinderer for some investigators to use the tool. In this paper we present a GUI and extensions for the Volatility Framework, which on the one hand simplify the usage of the tool and on the other hand offer additional functionality like storage of results in a database, shortcuts for long Volatility Framework command sequences, and entirely new commands based on correlation of data stored in the database.
Embedding fuzzy controllers in golog / Ferrein, Alexander ; Schiffer, Stefan ; Lakemeyer, Gerhard
(2009)
Future evolution of risk management for structures : Advancement for the future IEC 62305-2 Ed3
(2011)
Fundamentals and ignition of a microplasma at 2.45 GHZ / Holtrup, Stephan ; Heuermann, Holger
(2009)
Enhanced system architecture for rugged wide band data transmission / Sadeghfam, A. ; Heuermann, H.
(2009)
Chain scattering parameters or T-parameters are a useful tool for calculating cascaded two-ports. With the increasing importance of mixed-mode S-parameters, a need for converting the T-parameters from their unbalanced form into a balanced form emerges for suiting both common and differential mode waves, as well as the mode conversion. This paper presents the derivation of the equations for transformations between mixed-mode S- and T-parameters for a mixed-mode two-port. Although derived in a way very similar to monomode T-parameters, no simplifications were necessary. Measurement results exemplify the quality of the T-parameter transformation under real-life conditions.