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In: Proceedings of the 39th Annual Hawaii International Conference on System Sciences, 2006. HICSS '06 http://dx.doi.org/10.1109/HICSS.2006.200 The conceptual design phase at the beginning of the building construction process is not adequately supported by any CAD-tool. Conceptual design support needs regarding two aspects: first, the architect must be able to develop conceptual sketches that provide abstraction from constructive details. Second, conceptually relevant knowledge should be available to check these conceptual sketches. The paper deals with knowledge to formalize for conceptual design. To enable domain experts formalizing knowledge, a graph-based specification is presented that allows the development of a domain ontology and design rules specific for one class of buildings at runtime. The provided tool support illustrates the introduced concepts and demonstrates the consistency analysis between knowledge and conceptual design.
In: Proc. of the 11th Intl. Conf. on Computing in Civil and Building Engineering (ICCCBE-XI) ed. Hugues Rivard, Montreal, Canada, Seite 1-12, ACSE (CD-ROM), 2006 Currently, the conceptual design phase is not adequately supported by any CAD tool. Neither the support while elaborating conceptual sketches, nor the automatic proof of correctness with respect to effective restrictions is currently provided by any commercial tool. To enable domain experts to store the common as well as their personal domain knowledge, we develop a visual language for knowledge formalization. In this paper, a major extension to the already existing concepts is introduced. The possibility to define rule dependencies extends the expressiveness of the knowledge definition language and contributes to the usability of our approach.
Functional testing and characterisation of ISFETs on wafer level by means of a micro-droplet cell
(2006)
A wafer-level functionality testing and characterisation system for ISFETs (ionsensitive field-effect transistor) is realised by means of integration of a specifically designed capillary electrochemical micro-droplet cell into a commercial wafer prober-station. The developed system allows the identification and selection of “good” ISFETs at the earliest stage and to avoid expensive bonding, encapsulation and packaging processes for nonfunctioning ISFETs and thus, to decrease costs, which are wasted for bad dies. The developed system is also feasible for wafer-level characterisation of ISFETs in terms of sensitivity, hysteresis and response time. Additionally, the system might be also utilised for wafer-level testing of further electrochemical sensors.
A key feature of future broadband markets will be diversity of access technologies, meaning that numerous technologies will be exploited for broadband communication. Various factors will affect the success of these future broadband markets, the regulatory policy being one amongst others. So far, a coherent regulatory approach does not exist as to broadband markets. First results of policies so far suggest that less sector-specific regulation is likely to occur. Instead, regulators must ensure that access to networks and services of potentially dominant providers in a relevant broadband market will satisfy requirements for openness and non-discrimination. In this environment the future challenge of regulationg broadband markets will be to set the right incentives for investment into new infrastructures. This paper examines whether there is a need for the regulation of future broadband access markets an if yes, what is the appropriate regulatory tool to do so. Thereby the focus is on the analysis of European broadband markets and the regulatory approaches applied. The first section provides a description of the characteristics of future broadband markets. The second section discusses possible bottlenecks on broadband markets an their regulatory implications. The third section will examine regulatory issues concerning access to broadband networks in more detail. This will be done by comparing the regulatory approaches of European countries and the results in terms of bradband penetration. The final section will give key recommendations for a regulatory strategy on brandband access markets.
Hands-on-training in high technology areas is usually limited due to the high cost for lab infrastructure and equipment. One specific example is the field of MEMS, where investment and upkeep of clean rooms with microtechnology equipment is either financed by production or R&D projects greatly reducing the availability for education purposes. For efficient hands-on-courses a MEMS training foundry, currently used jointly by six higher education institutions, was established at FH Kaiserslautern. In a typical one week course, students manufacture a micromachined pressure sensor including all lithography, thin film and packaging steps. This compact and yet complete program is only possible because participants learn to use the different complex machines in advance via a Virtual Training Lab (VTL). In this paper we present the concept of the MEMS training foundry and the VTL preparation together with results from a scientific evaluation of the VTL over the last three years.
Table of contents 1. Introduction 2. Multi-level Technology Transfer Infrastructure 2.1 Level 1: University Education – Encourage the Idea of becoming an Entrepreneur 2.2 Level 2: Post Graduate Education – Improve your skills and focus it on a product family. 2.3 Level 3: Birth of a Company – Focus your skills on a product and a market segment. 2.4 Level 4: Ready to stand alone – Set up your own business 2.5 Level 5: Grow to be Strong – Develop your business 2.6 Level 6: Competitive and independent – Stay innovative. 3. Samples 3.1 Sample 1: Laser Processing and Consulting Centre, LBBZ 3.2 Sample 2: Prototyping Centre, CP 4. Funding - Waste money or even lost Money? 5. Conclusion
Study of swift heavy ion modified conduction polymer composites for application as gas sensor
(2006)
A polyaniline-based conducting composite was prepared by oxidative polymerisation of aniline in a polyvinylchloride (PVC) matrix. The coherent free standing thin films of the composite were prepared by a solution casting method. The polyvinyl chloride-polyaniline composites exposed to 120 MeV ions of silicon with total ion fluence ranging from 1011 to 1013 ions/cm2, were observed to be more sensitive towards ammonia gas than the unirradiated composite. The response time of the irradiated composites was observed to be comparably shorter. We report for the first time the application of swift heavy ion modified insulating polymer conducting polymer (IPCP) composites for sensing of ammonia gas.