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A. Roelofs (3)
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2004
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2001
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Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
(2001)
Klaus Prume
;
S. Tiedke
;
T. Schmitz
;
A. Roelofs
Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; Kügeler, C.; Böttger, U. ; Waser, R. ; Prume, K. ;
(2004)
Klaus Prume
;
P. Gerber
;
A. Roelofs
;
C. Kügeler
In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
(2004)
Klaus Prume
;
B. Reichenberg
;
A. Roelofs
;
R. Waser
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