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Andreas Roelofs (1)
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2004 (1)
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Fachbereich Elektrotechnik und Informationstechnik (1)
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Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; Kügeler, C. ; Roelofs, A. ; Böttger, U. ; Waser, R. ; Schmitz-Kempen,
(2004)
Klaus Prume
;
Peter Gerber
;
Carsten Kügeler
;
Andreas Roelofs
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