English
Anmelden
Open Access
Startseite
Suchen
Browsen
Administration
FAQ
Filtern
Autor
Bernd Reichenberg (1)
(entfernen)
1
Treffer
1
bis
1
Export
BibTeX
CSV
RIS
20
10
20
50
100
Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb
(2002)
Klaus Prume
;
Andreas Roelofs
;
Thorsten Schmitz
;
Bernd Reichenberg
1
bis
1