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Klaus Prume (19)
(entfernen)
Erscheinungsjahr
2008
(1)
2007
(6)
2005
(2)
2004
(3)
2002
(2)
2001
(2)
2000
(3)
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Wissenschaftlicher Artikel
(18)
Buch (Monographie)
(1)
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Englisch
(18)
Deutsch
(1)
19
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19
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Taking piezoelectric microsystems from the laboratory to production / Raeder, H. ; Tyholdt, F. ; Booij, W. ; Calame, F. ; Ostbo, N. P. ; Bredesen, R. ; Prume, K. ; Rijnders, G. ; Muralt, P.
(2007)
Klaus Prume
;
H. Raeder
;
F. Tyholdt
;
W. E. Booij
Simulation and measurements of the piezoelectric properties response (d33) of piezoelectric layered thin film structures influenced by the top-electrode size / Prume, K. ; Gerber, P. ; Kügeler, C. ; Roelofs, A. ; Böttger, U. ; Waser, R. ; Schmitz-Kempen,
(2004)
Klaus Prume
;
Peter Gerber
;
Carsten Kügeler
;
Andreas Roelofs
Piezoelectric thin films: evaluation of electrical and electromechanical characteristics for MEMS devices / Prume, K. ; Muralt, P. ; Calame, F. ; Schmitz-Kempen, T. ; Tiedke, S. ;
(2007)
Klaus Prume
;
P. Muralt
;
F. Calame
;
T. Schmitz-Kempen
Modelling and numerical simulation of the electrical, mechanical, and thermal coupled behaviour of Multilayer capacitors (MLCs) / Prume, Klaus ; Franken, Klaus ; Böttger, Ulrich ; Waser, Rainer ; Maier, Horst R.
(2002)
Klaus Prume
;
Klaus Franken
;
Ulrich Böttger
;
Rainer Waser
Modellierung und Simulation der elektrisch-thermisch-mechanisch gekoppelten Eigenschaften keramischer Vielschichtstrukturen
(2001)
Klaus Prume
In-situ compensation of the parasitic capacitance for nanoscale hysteresis measurements / Schmitz, T. ; Prume, K. ; Reichenberg, B. ; Roelofs, A. ; Waser, R. ; Tiedke, S.
(2004)
Klaus Prume
;
B. Reichenberg
;
A. Roelofs
;
R. Waser
Finite-element simulation of coupled characteristics of ceramic multilayer capacitors under transient electrical loading / Prume, Klaus ; Waser, Rainer
(2000)
Klaus Prume
;
Rainer Waser
Finite-Element Analysis of Ceramic Multilayer Capacitors: Modeling and Electrical Impedance Spectroscopy for a Nondestructive Failure Test / Prume, Klaus ; Waser, Rainer ; Franken, Klaus ; Maier, Horst R. ;
(2000)
Klaus Prume
;
Rainer Waser
;
Klaus Franken
;
Horst R. Maier
Finite-Element Analysis of Ceramic Multilayer Capacitors: Failure Probability Caused by Wave Soldering and Bending Loads / Franken, Klaus ; Maier, Horst R. ; Prume, Klaus ; Waser, Rainer
(2000)
Klaus Prume
;
Klaus Franken
;
Horst R. Maier
;
Rainer Waser
Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals / Prume, Klaus ; Muralt, Paul ; Calame, Florian ; Schmitz-Kempen, Thorsten ; Tiedke, Stephan
(2007)
Klaus Prume
;
Paul Muralt
;
Florian Calame
;
Thorsten Schmitz-Kempen
Electrical and electromechanical characterization of piezoelectric thin films in view of MEMS application / Tiedke, S. ; Prume, K. ; Schmitz-Kempen, T.;
(2007)
Klaus Prume
Effects of the top-electrode size on the piezoelectric properties (d33 and S) of lead zirconate titanate thin films / Gerber, P. ; Roelofs, A. ; Kügeler, C.; Böttger, U. ; Waser, R. ; Prume, K. ;
(2004)
Klaus Prume
;
P. Gerber
;
A. Roelofs
;
C. Kügeler
Effective Piezoelectric Coefficients of Ferroelectric Thin Films on Elastic Substrates / Zalachas, Nicolas ; Laskewitz, Bernd ; Kamlah, Marc ; Prume, Klaus ; Lapusta, Yuri ; Tiedke, Stephan
(2008)
Klaus Prume
;
Nicolas Zalachas
;
Bernd Laskewitz
;
Marc Kamlah
Dynamic leakage current compensation in ferroelectric thin-film capacitor structures / Meyer, René ; Waser, Rainer ; Prume, Klaus ; Schmitz, Torsten ; Tiedke, Stephan
(2005)
Klaus Prume
;
René Meyer
;
Rainer Waser
;
Torsten Schmitz
Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
(2001)
Klaus Prume
;
S. Tiedke
;
T. Schmitz
;
A. Roelofs
Compensation of the Parasitic Capacitance of a Scanning Force Microscope Cantilever Used for Measurements on Ferroelectric Capacitors of Submicron Size by Means of Finite Element Simulations / Prume, Klaus ; Roelofs, Andreas ; Schmitz, Thorsten ; Reichenb
(2002)
Klaus Prume
;
Andreas Roelofs
;
Thorsten Schmitz
;
Bernd Reichenberg
Chemically derived seeding layer for {100}-textured PZT thin films / Tyholdt, F. ; Calame, F. ; Prume, K. ; Raeder, H. ; Muralt, P.
(2007)
Klaus Prume
;
F. Tyholdt
;
F. Calame
;
H. Raeder
Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates / Peter, F. ; Rüdiger, A. ; Dittmann, R. ; Waser, R. ; Szot, K. ; Reichenberg, B. ; Prume, K. ;
(2005)
Klaus Prume
;
F. Peter
;
A. Rüdiger
;
R. Dittmann
A simple and powerful analytical model for MEMS piezoelectric multimorphs / Booij, W. E. ; Vogl, A. H. ; Wang, D. T. ; Tyholdt, F. ; Ostbo, N. P. ; Raeder, H. ; Prume, K.
(2007)
Klaus Prume
;
W. E. Booij
;
A. H. Vogl
;
D. T. Wang
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