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P. Boege (2)
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1994
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1993
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Improved conductivity-measurement of semiconductor epitaxial layers by means of the contactless microwave method
(1994)
Horst Schäfer
;
P. Boege
;
Xu Shanjia
;
Wu (u.a.) Xinzhang
Scattering Characteristics of 3-D Discontinuity Consisting of Semiconductor Sample Filled in Waveguide with Gaps
(1993)
Horst Schäfer
;
Xu Shanjia
;
Wu Xinzhang
;
P. Boege
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