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B. Schiek (5)
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1997
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15-term self-calibration methods for the error-correction of on-wafer measurements
(1997)
Holger Heuermann
;
B. Schiek
Procedures for the Determination of the Scattering Parameters for Network Analyzer Calibration
(1993)
Holger Heuermann
;
B. Schiek
Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures
(1994)
Holger Heuermann
;
B. Schiek
Error corrected impedance measurements with a network analyzer
(1995)
Holger Heuermann
;
B. Schiek
Results of network analyzer measurements with leakage errors-corrected with direct calibration techniques
(1997)
Holger Heuermann
;
B. Schiek
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