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Holger Heuermann (7)
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1994 (7)
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Article (7)
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Sichere on-wafer-Streuparameter-Messungen mit Selbstkalibrierverfahren
(1994)
Holger Heuermann
;
Burkhard Schiek
Scattering Parameter Measurements of Microstrip Devices using the Double-LNN Calibration Technique
(1994)
Holger Heuermann
;
Burkhard Schiek
Robust Algorithms for Txx Network Analyzer Self-Calibration Procedures
(1994)
Holger Heuermann
;
B. Schiek
Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
(1994)
Holger Heuermann
;
Burkhard Schiek
Results of Network Analyzer Measurements with Leakage Errors Corrected with the TMS-15-Term Procedure
(1994)
Holger Heuermann
;
F.-M. Baumann
;
G. Fauth
;
M. Albert
Error Corrected Impedance Measurements with a Network Analyzer
(1994)
Holger Heuermann
;
Burkhard Schiek
Calibration of network analyser measurements with leakage errors
(1994)
Holger Heuermann
;
Burkhard Schiek
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