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DX Centers in Al0.3Ga0.7As/GaAs Analyzed by Point Contact Measurements. Hauke, M.; Jakumeit, J.; Krafft, B.; Nimtz, G.; Förster, A.; Lüth, H.
(1998)
Arnold Förster
;
M. Hauke
;
J. Jakumeit
;
B. Krafft
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