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Author
Prume, Klaus
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Roelofs, A.
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Schmitz, T.
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Tiedke, S.
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2001 (1)
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Fachbereich Elektrotechnik und Informationstechnik
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Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope / Tiedke, S. ; Schmitz, T. ; Prume, K. ; Roelofs, A. ; Schneller, T. ; Kall, U. ; Waser, R. ; Ganpule, C. S. ; Nagarajan, V. ; Stanishevs
(2001)
Prume, Klaus
;
Tiedke, S.
;
Schmitz, T.
;
Roelofs, A.
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